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SYSTEMES ET PROCEDES DE MESURE DE CARACTERISTIQUES FACIALES
专利权人:
INC.;VSP LABS
发明人:
CHOLAYIL, SAMEER,DOAN, BRIAN HUNG,PHAM, PHUONG THI XUAN
申请号:
CA2920728
公开号:
CA2920728A1
申请日:
2014.08.12
申请国别(地区):
CA
年份:
2015
代理人:
摘要:
Systems and methods for measuring facial characteristics of patients. In various embodiments, the system uses a geometric pattern to determine a reference scale for an image that includes the geometric pattern and at least a portion of the patient's face. The system may determine the reference scale based at least in part on a known measurement within the geometric pattern. The known measurement may include a distance between two geometric attributes of the geometric pattern. The system may be further configured to correct for errors caused by an orientation of the geometric pattern within the image and/or distortion of the geometric pattern within the image. The geometric pattern may be disposed on a reference device that may be configured to enable a user to attach the reference device to the head of the patient or a pair of eyewear worn by the patient.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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