한국전기연구원;KOREA ELECTROTECHNOLOGY RESEARCH INSTITUTE
发明人:
HEO, DU CHANG,허두창,YANG, KEE DONG,양기동,JEON, SUNG CHAE,전성채,CHA, BO KYUNG,차보경,HEO, DU CHANGKR,YANG, KEE DONGKR,JEON, SUNG CHAEKR,CHA, BO KYUNGKR
申请号：
KR1020120134309
公开号：
KR1020140067270A
申请日:
2012.11.26
申请国别(地区):
KR
年份:
2014
代理人:
摘要：
The present invention relates to an X-ray detecting device and, more specifically, to an X-ray detecting device capable of improving the efficiency of detecting X-rays, which is essentially required for a radiation field, by increasing the efficiency of detecting visible rays generated by the X-rays. The present invention is characterized by including a scintillator structure which generates visible rays from the inside thereof by the emitted X-rays； a light detecting unit which is joined to the lower part of the scintillator structure and which detects the visible rays which are emitted to the lower side of the scintillator structure after being generated inside the scintillator structure； and a reflection layer which is formed on the upper part of the scintillator structure and which reflects the visible rays, which are emitted to the upper part of the scintillator structure after being generated inside the scintillator structure, to the light detecting unit. The present invention can emit the visible rays, which are emitted to other regions except for a region where the light detecting unit is arranged after being generated inside the scintillator structure by the X-rays emitted toward the scintillator structure, toward the light detecting unit after reflecting the visible rays with the reflection layer formed on the upper part of the scintillator structure and a barrier formed on the scintillator structure, thereby increasing the X-ray detecting efficiency of the light detecting unit. As a result, the X-ray detecting device has an effect capable of increasing the efficiency of detecting X-rays.본 발명은 엑스선 검출 장치에 관한 것이다. 보다 상세하게는 엑스선에 의해 발생되는 가시광에 대한 검출 효율을 증가시킴으로써 방사선 분야에서 필수적으로 요구되는 엑스선 검출 효율을 향상시킬 수 있는 엑스선 검출 장치에 관한 것이다. 본 발명은 조사되는 엑스선에 의해 내부에서 가시광이 발생되는 섬광체 구조물； 상기 섬광체 구조물 하부에 결합되며 상기 섬광체 구조물 내부에서 발생된 후 상기 섬광체 구조물 하부로 조사되는 가시광을 검출하는 광검출부； 및 상기 섬광체 구조물 상부에 형성되며 상기 섬광체 구조물 내부에서 발생된 후 상기 섬광체 구조물 상부로 조사되는 가시광을 상기 광검출부 측으로 반사시키는 반사층을 포함하는 것을 특징으로 한다. 본 발명에 의하면 섬광체 구
