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SKIN LANDMARK AND ANOMALY MEASUREMENT TOOL
专利权人:
Janel Parker Schilling
发明人:
Janel Parker Schilling
申请号:
US14582821
公开号:
US20150216613A1
申请日:
2014.12.24
申请国别(地区):
US
年份:
2015
代理人:
摘要:
Some embodiments of the present disclosure include a device for recording the location, size, and shape of anomalies and skin landmarks, such as scars, mass clusters, and the like. The device may include a substantially sector-shaped semitransparent marking base having a plurality of transparent regions and a removable backing. The marking base may include a plurality of semitransparent marking scales that define the transparent regions, wherein the entire device is configured to allow a user to trace anomalies and skin landmarks thereon, creating a permanent, accurate, and actual-size mapping of the subjects skin. In some embodiments, the marking base may be made of a vinyl material.
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