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DETERMINING TWO-DIMENSIONAL IMAGE DATA FROM AT LEAST ONE SECTIONAL SURFACE OF AN ACQUISITION VOLUME AS PART OF A MAGNETIC RESONANCE IMAGING PROCESS
专利权人:
Dirk Ertel
发明人:
Dirk Ertel,Yiannis Kyriakou
申请号:
US15663749
公开号:
US20180031655A1
申请日:
2017.07.29
申请国别(地区):
US
年份:
2018
代理人:
摘要:
A method for determining two-dimensional image data from at least one sectional surface of an acquisition volume as part of a magnetic resonance imaging process by a combined apparatus, including a magnetic resonance imaging facility and an X-ray facility, is provided. The method includes controlling the X-ray facility to acquire at least one X-ray image that images at least part of an object. At least one piece of object information is determined by image processing the X-ray image. At least one sectional-surface parameter that defines an arrangement of the sectional surface in the acquisition volume is determined. The magnetic resonance imaging facility is controlled to acquire measurement data relating to the sectional surface. The two-dimensional image data is calculated from the measurement data. The sectional-surface parameter is used as the basis for the control of the magnetic resonance imaging facility and/or for the calculation of the two-dimensional image data.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
相关发明人
dirk ertel
yiannis kyriakou
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