您的位置: 首页 > 农业专利 > 详情页

CORRECTION IN SLIT-SCANNING PHASE CONTRAST IMAGING
专利权人:
发明人:
ROESSL EWALD,MARTENS GERHARD
申请号:
IN201647002869
公开号:
IN201647002869A
申请日:
2016.01.27
申请国别(地区):
IN
年份:
2016
代理人:
摘要:
The present invention relates to calibration in X ray phase contrast imaging. In order to remove the disturbance due to individual gain factors a calibration filter grating (10) for a slit scanning X ray phase contrast imaging arrangement is provided that comprises a first plurality of filter segments (11) comprising a filter material (12) and a second plurality of opening segments (13). The filter segments and the opening segments are arranged alternating as a filter pattern (15). The filter material is made from a material with structural elements (14) comprising structural parameters in the micrometer region. The filter grating is movably arranged between an X ray source grating (54) and an analyzer grating (60) of an interferometer unit in a slit scanning system of a phase contrast imaging arrangement. The slit scanning system is provided with a pre collimator (55) comprising a plurality of bars (57) and slits (59). The filter pattern is aligned with the pre collimator pattern (61).
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充