光波長測定方法および光波長測定装置

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专利权人:

国立大学法人大阪大学

发明人:

小西 毅,佐藤 豪真,永島 知貴

申请号：

JP20150505282

公开号：

JP6056096(B2)

申请日:

2014.03.10

申请国别(地区):

日本

年份:

2017

代理人:

摘要：

A light wavelength measurement method of measuring a wavelength of target light includes: receiving target light on a second dispersion device that disperses the target light into a plurality of second beams which reach a plurality of positions corresponding to the wavelength of the target light (S106, S202); and measuring the wavelength of the target light, by using the plurality of the second beams as a vernier scale for measuring the wavelength of the target light within a wavelength range specified by a main scale (S108, S204).

来源网站：

中国工程科技知识中心

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http://www.ckcest.cn/home/