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METHOD OF MEASURING ELECTRICAL RESISTANCE VALUE OF CORNEAL TRANS-EPITHELIUM
专利权人:
NAGASAKI UNIVERSITY
发明人:
UEMATSU, MASAFUMI,KITAOKA, TAKASHI,NISHIDA, KOJI,TANAKA, YUJI,NISHIZAWA, MATSUHIKO,KAJI, HIROKAZU,SEKINE, SOICHIRO
申请号:
EP09717554
公开号:
EP2248459A4
申请日:
2009.03.03
申请国别(地区):
EP
年份:
2014
代理人:
摘要:
The present invention provides an evaluation method of a corneal disorder that can measure a disorder of a cornea quantitatively and is applicable to living eyes. A method for measuring a corneal transepithelial electric resistance comprises placing electrodes on the cornea and a conjunctiva. The method for measuring a corneal transepithelial electric resistance comprises: (1) a step of placing a first electrode on the cornea and a second electrode on the conjunctiva and (2) a step of flowing an electric current between the first electrode and the second electrode to measure the electric resistance. And a device for measuring a corneal transepithelial electric resistance value.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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