X-ray Phase Contrast Imaging Apparatus

• 收藏
• 分享

专利权人:

OSAKA UNIVERSITY;Shimadzu Corporation

发明人:

Akira HORIBA,Koichi TANABE,Toshinori YOSHIMUTA,Kenji KIMURA,Hiroyuki KISHIHARA,Yukihisa WADA,Takuro IZUMI,Taro SHIRAI,Takahiro DOKI,Satoshi SANO,Takayoshi SHIMURA,Heiji WATANABE,Takuji HOSOI

申请号：

US16319574

公开号：

US20200158662A1

申请日:

2017.07.10

申请国别(地区):

US

年份:

2020

代理人:

摘要：

This X-ray phase contrast imaging apparatus (100) includes an X-ray source (1), a first grating (3) that forms a self-image, a second grating (4), a detector (5) that detects X-rays, an adjustment mechanism (6), and a controller (7) that controls the adjustment mechanism (6) to adjust a misalignment of the first grating (3) or a misalignment of the second grating (4) based on Moire fringes detected by the detector (5).

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/