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ULTRASONIC PROBE ATTACHMENT, ULTRASONIC PROBE, ULTRASONIC INSPECTION APPARATUS AND ULTRASONIC INSPECTION METHOD
专利权人:
SAMSUNG ELECTRONICS CO.; LTD.
发明人:
Kazuo IIJIMA
申请号:
US15516481
公开号:
US20170290564A1
申请日:
2015.10.02
申请国别(地区):
US
年份:
2017
代理人:
摘要:
An attachment for ultrasound probe, an ultrasound probe, an ultrasound inspecting apparatus, and an ultrasound inspecting method are provided. The attachment for ultrasound probe includes an acoustic matching element provided on a transceiver of an ultrasound probe and deformed based on a surface of an inspection target when the ultrasound probe scans the surface of the inspection target; a medium supplier provided near the acoustic matching element and configured to provide a medium between the inspection target and the acoustic matching element, based on the deformation of the acoustic matching element; and a body configured to fix the acoustic matching element and the medium supplier to the ultrasound probe.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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