DISPOSITIF DE CAPTURE D'IMAGES À SEMI-CONDUCTEURS, SYSTÈME DE CAPTURE D'IMAGES À SEMI-CONDUCTEURS, ET PROCÉDÉ DE COMMANDE DE DISPOSITIF DE CAPTURE D'IMAGES À SEMI-CONDUCTEURS
The present embodiment relates to a radiation imaging system and the like provided with a solid-state imaging device having a structure enabling reduction of linear noise appearing in an integrated image. The solid-state imaging device comprises: L pieces of imaging pixel region arranged along a direction crossing a moving direction of a relative position of the solid-state imaging device； and L pieces of A/D converter provided corresponding to the L pieces of imaging pixel region. Each imaging pixel region includes pixels arranged two-dimensionally to form an M-row by N-column matrix. Any one of the L pieces of A/D converter executes a dummy A/D conversion once or more times after an A/D conversion of an electric signal from a pixel of an m-th row, before an A/D conversion of an electric signal from a pixel of an (m + 1)-th row.
