PROBLEM TO BE SOLVED: To provide an evoked potential inspection device which can shorten measuring time while maintaining high inspection accuracy.SOLUTION: An evoked potential inspection device 1 includes an ASSR evoked potential signal data recording unit for recording ASSR evoked potential signal data, a waveform inference processing unit for carrying out a waveform inference processing for the ASSR evoked potential signal data recorded by the ASSR evoked potential signal data recording unit by means of a Kalman filter, a hearing ability judgment processing unit for carrying out a hearing ability judgment processing for the waveform signal data inferred by the waveform inference processing unit, and a display control unit for making a display device 5 show a result processed by the hearing ability judgment processing unit.COPYRIGHT: (C)2013,JPO&INPIT【課題】高い検査精度を有しながらもより測定時間の短縮を行うことが可能な誘発電位検査装置を提供する。【解決手段】ASSR誘発電位信号デ-タを記録するASSR誘発電位信号デ-タ記録部と、ASSR誘発電位信号デ-タ記録部が記録したASSR誘発電位信号デ-タに対してカルマンフィルタによる波形推定処理を行う波形推定処理部と、波形推定処理部が推定した波形信号デ-タに対して聴力判定処理を行う聴力判定処理部と、聴力判定処理部が処理した結果を表示装置5に表示させるための表示制御部とを有する誘発電位検査装置1とする。【選択図】図1
