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SLIT-LAMP MICROSCOPE
专利权人:
KABUSHIKI KAISHA TOPCON
发明人:
UCHIYAMA,TAKUMI
申请号:
EP12800500
公开号:
EP2721995A4
申请日:
2012.05.16
申请国别(地区):
EP
年份:
2014
代理人:
摘要:
A slit lamp microscope capable of appropriately and easily carrying out the setting of the optical system is provided. In storage 102 of a slit lamp microscope 1, correspondence information 110 is stored in which standard setting conditions of an illumination system 8 and/or an observation system 6 are associated with each of multiple sites of an eye E. A searching part 121 searches the standard setting conditions corresponding to a site designated by an operation part 104 from the correspondence information 110. A setting-state acquiring part 122 acquires current setting states of the illumination system 8 and/or the observation system 6. A setting-state specifying part specifies, from among the current setting states acquired by the setting-state acquiring part 122, those differing from the standard setting conditions searched by the searching part 121. A controller displays information based on this specified result on the display 103.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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