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Method and Apparatus for Examining Eggs
专利权人:
Bart De Ketelaere
发明人:
Bart De Ketelaere,Josse De Baerdemaeker,Jeroen Evert Jan Brunnenkreef
申请号:
US13883320
公开号:
US20130283894A1
申请日:
2011.11.03
申请国别(地区):
US
年份:
2013
代理人:
摘要:
This invention relates to a method and apparatus for examining eggs, in particular for determining eggshell characteristics of eggs, the method comprising,—positioning the eggs to be examined,—with a deformer, deforming a part of such an egg at least once,—at least determining deformation contact time, and—determining the shell stiffness and/or the eggshell strength of such an egg. Such a manner of detection can be suitably applied to sorting machines for eggs. With this methodology, in a short time, for a very large number of products, such as eggs in the present case, a quality parameter such as the strength and/or stiffness can be determined. With such determinations, in an advantageous manner, high requirements set in many fields of technology and industry can be met.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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