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APPARATUS AND METHODS FOR DETERMINING FORCE APPLIED TO THE TIP OF A PROBE
专利权人:
发明人:
ANUMBA DILICHUKWU,HEALEY TIMOTHY JAMES
申请号:
IN201827020502
公开号:
IN201827020502A
申请日:
2018.05.31
申请国别(地区):
IN
年份:
2018
代理人:
摘要:
An apparatus capable of determining the force applied to the tip of an electrical impedance spectroscopy probe comprises: an elongate probe comprising a probe tip attached to a handle the probe tip having a substantially planar distal end for contacting human or animal tissue a load cell located in said handle and capable of measuring a force Floadcell applied axially along a longitudinal axis when said probe tip is in contact with said human or animal tissue an accelerometer located in the handle for measuring a gravity vector Aaxial processing means for compensating for the mass of the probe tip using said measured force and gravity vector to produce a calibrated measurement of force F applied to said probe tip.
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中国工程科技知识中心
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