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Controlling effects caused by exposure of an implantable medical device to a disruptive energy field
专利权人:
Sandy K. Wixon;Joel Peltier;Jonathan Edmonson;Sung-Min Park;Ben W. Herberg;David E. Manahan;Christopher C. Stancer;Piotr J. Przybyszewski
发明人:
Christopher C. Stancer,Piotr J. Przybyszewski,Sandy K. Wixon,Joel Peltier,Sung-Min Park,David E. Manahan,Jonathan Edmonson,Ben W. Herberg
申请号:
US12828081
公开号:
US08494649B2
申请日:
2010.06.30
申请国别(地区):
US
年份:
2013
代理人:
摘要:
Techniques are described for controlling effects caused when an implantable medical device (IMD) is subject to a disruptive energy field. The IMD may include an implantable lead that includes one or more electrodes. The IMD may further include a first component having a parasitic inductance. The IMD may further include a second component having a reactance. In some examples, the reactance of the second component may be selected based on the parasitic inductance of the first component such that an amount of energy reflected along the lead in response to energy produced by an electromagnetic energy source is below a selected threshold. In additional examples, the parasitic inductance of the first component and the reactance of the second component are configured such that an amount of energy reflected along the lead in response to a frequency of electromagnetic energy is below a selected threshold.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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