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ANALYTE TEST STRIP AND ANALYTE METER DEVICE
专利权人:
Agamatrix, Inc.
发明人:
IYENGAR, Sridhar,HARDING, Ian,BOITEAU, Charles,BUTTERS, Colin
申请号:
EP20110804212
公开号:
EP2591337(A4)
申请日:
2011.06.30
申请国别(地区):
欧洲专利局
年份:
2018
代理人:
摘要:
A test strip with an incorporated optical waveguide and deflectors punched through the optical waveguide allows light to exit through a layer of the test strip and be detected by a photo detector. Using light and a photodetector, these uniquely coded strips are identified. The waveguide can be constructed by sandwiching two layers of the test strip around a light transmissible layer. This configuration allows light to be transmitted through the test strip and out the other end, as well as allowing some light to escape the deflector. This light is detected by a photodetector mounted in the analyte test meter. The deflectors may be placed in patterns such that detection of this light indicates certain characteristics of the strip, such as non-counterfeit, regional identification, type of analyte tested, and coding information.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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