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3D 3D wireless gamma probe and method of measuring radiation intensity thereof
专利权人:
JS TECHWIN CO., LTD.;PARK, HYEUN SUK;SUH, JUN SUHK;(주) 제이에스테크윈;서준석;박현숙
发明人:
서준석,박현숙,SUH, JUN SUHKKR,PARK, HYEUN SUKKR
申请号:
KR1020180160082
公开号:
KR1021045450000B1
申请日:
2018.12.12
申请国别(地区):
KR
年份:
2020
代理人:
摘要:
The present invention relates to a 3D wireless gamma probe and a method for measuring the intensity of radiation thereof, a pattern light source 110 and an aperture (for emitting pattern light having a predetermined pattern on the light to the apertures 120-1 and 120-2) 120-1) An optical component 130 for controlling the reflected light reflected from the object 300 by the pattern light and the pattern light emitted from the pattern light source 110 through 120-2, and the object 300 by the pattern light ), The image sensor 140 for sensing a two-dimensional image formed by the reflected light reflected, a flash sensor 150 for measuring radiation on the subject 300, a light multiplication for multiplying the light emitted from the flash sensor 150 A device 160, a signal pre-processing unit 170 for converting light corresponding to radiation and two-dimensional image images into electrical signals, and a Bluetooth module 180 for wirelessly transmitting electrical signals corresponding to radiation and two-dimensional image images are provided. One 3D wireless probe 100; And a Bluetooth module 210 that receives electrical signals corresponding to radiation and two-dimensional image images wirelessly transmitted from the 3D wireless probe 100, obtains a distance to a subject by radiation and two-dimensional image images, and corrects the radiation intensity. It comprises a control unit (200) with a control unit (220) for shaping the subject image in three dimensions by means of a two-dimensional image image and a display (230) for outputting an image of the subject shaped in three dimensions and radiation intensity. .본 발명은 3D 무선 감마 프로브와 이의 방사선 세기 측정방법에 관한 것으로, 광에 소정의 패턴을 형성한 패턴 광을 조리개(120-1)(120-2)로 출사하는 패턴 광원(110), 조리개(120-1)(120-2)를 통해 패턴 광원(110)에서 출사된 패턴 광 및 패턴 광에 의해 피사체(300)에 반사되는 반사광을 조절하는 광학 부품(130), 패턴 광에 의해 피사체(300)에 반사되는 반사광에 의해 형성되는 2차원 영상을 센싱하는 이미지 센서(140), 피사체(300)에 방사선을 측정하는 섬광 센서(150), 섬광센서(150)에서 방사된 빛을 증배하는 광증배 소자(160), 방사선 및 2차원 이미지 영상에 대응하는 빛을 전기신호로 변환하
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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