您的位置: 首页 > 农业专利 > 详情页

EIT MEASUREMENT DEVICE, EIT MEASUREMENT METHOD AND PROGRAM
专利权人:
School Juridical Person The Kitasato Institute
发明人:
NEBUYA, Satoru,HIFUMI, So
申请号:
EP14820626
公开号:
EP3017758A4
申请日:
2014.07.01
申请国别(地区):
EP
年份:
2017
代理人:
摘要:
An electrical impedance tomography (EIT) measurement device (1) includes a measurement belt (10) to which a plurality of electrode pads arranged in a row and a plurality of strain gauges arranged in parallel to the plurality of electrode pads are integrally adhered and configured to be used after being wrapped around a portion (X) serving as a measurement target of a living body, an EIT measurement control unit configured to acquire a tomographic image of the portion (X) serving as the measurement target while applying a current to the plurality of electrode pads and acquiring a voltage signal generated between the electrode pads, and a contour estimation unit configured to estimate a contour shape of the portion serving as the measurement target and a size of the contour shape on the basis of curvature data acquired via the strain gauge.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充