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MAGNETIC RESONANCE IMAGING APPARATUS AND METHOD FOR DETERMINING HIGH-FREQUENCY MAGNETIC FIELD SHIM PARAMETER
专利权人:
LTD.;HITACHI
发明人:
Taku YOSHIDA,Atsushi KURATANI
申请号:
US15318583
公开号:
US20170131371A1
申请日:
2015.06.10
申请国别(地区):
US
年份:
2017
代理人:
摘要:
In an MRI apparatus, RF shimming is performed with high precision in a short time irrespective of an object and an imaging mode. A database storing the shim parameter according to a change from a criterion state in advance is included when a state in which an shim parameter is calculated is set as the criterion state of the objet in order to obtain a high-quality image. At the time of imaging, the shim parameter registered in the database in association with a change amount closest to a change amount from the criterion state is used. In the database, the shim parameter calculated from a previously measured result is registered.
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