PROBLEM TO BE SOLVED: To provide an optical grain evaluation apparatus in which inconvenience that light irradiated from a light-projecting surface to a grain storage space is directly made incident to a light-receiving surface is reduced, and a manufacturing cost of a light-projecting part and a light-receiving part is reduced.SOLUTION: An optical grain evaluation apparatus comprises: a light-projecting part 41 having a light-projecting surface 416 which irradiates grains in a stored state with light a light-receiving part 42 having a light-receiving surface 426 to which a part of light, which is irradiated from the light-projecting surface 416 to grains and affected by the grains, is made incident and placed in parallel with the light-projecting surface at a gap a shielding part 434 which is provided between the light-projecting surface 416 and the light-receiving surface 426 in a protruded manner toward the grains to prevent light from being directly made incident from the light-projecting surface 416 to the light-receiving surface 426 a light source unit which supplies light to the light-projecting part 41 and a grain evaluation unit which performs grain evaluation based on spectroscopic measurement of light taken into the light-receiving part 42.COPYRIGHT: (C)2015,JPO&INPIT【課題】投光面から穀粒貯留空間に向かって照射された光が直接受光面に入射してしまう不都合が低減され、投光部及び受光部の製造コストが抑制される光学式穀粒評価装置。【解決手段】貯留状態の穀粒に光を照射する投光面416を有する投光部41と、投光面416から穀粒に照射され穀粒の影響を受けた光の一部が入射するとともに投光面と間隔をあけて並置している受光面426を有する受光部42と、投光面416から受光面426に光が直接入射しないように投光面416と受光面426との間で穀粒側に突出するように設けられた遮蔽部434と、投光部41に光を供給する光源ユニットと、受光部42に取り込まれた光の分光計測に基づいて穀粒評価を行う穀粒評価ユニットとが備えられている。【選択図】図1
