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METHOD AND DEVICE FOR DETECTING INCIPIENT A-V NODE MALFUNCTION
专利权人:
Anders Lindgren
发明人:
Anders Lindgren
申请号:
US13516178
公开号:
US20120259234A1
申请日:
2009.12.22
申请国别(地区):
US
年份:
2012
代理人:
摘要:
The present invention generally relates to implantable stimulation devices, such as pacemakers, defibrillators, and cardioverters, and, in particular, to implantable medical devices using atrial based pacing such as an AAI pacing mode and methods for such implantable medical devices for detecting early stages of incipient A-V node malfunction as well as presence of A-V node malfunction. An AV conduction capacity is detected, wherein a sensed ventricular event following an intrinsic or paced atrial event during a predetermined period of time indicates good AV conduction capacity and wherein absence of a ventricular event within the predetermined period of time indicates poor AV conduction capacity. At least one A-V node function parameter indicating a function of the A-V node is determined, wherein the A-V node function parameter includes whether a status of the AV conduction capacity is good or poor. Incipient A-V node malfunction is detected where poor AV conduction capacity indicates incipient A-V node malfunction.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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