您的位置: 首页 > 农业专利 > 详情页

Method of examining locations in a wafer with adjustable navigation accuracy and system thereof
专利权人:
APPLIED MATERIALS ISRAEL LTD.
发明人:
Kaizerman Idan,Geshel Mark
申请号:
US201615222824
公开号:
US10161882(B1)
申请日:
2016.07.28
申请国别(地区):
美国
年份:
2018
代理人:
Lowenstein Sandler LLP
摘要:
A method, computerized system and computer program product for examining an object using a processor operatively connected to a memory, the method comprising: accommodating in the memory data indicative of a plurality of alignment targets, each alignment target associated with a target location on an object; accommodating in the memory a plurality of locations to be captured; and selecting by the processor an alignment target subset of the plurality of alignment targets, such that each of the plurality of locations is associated with and is within a determined distance from a single alignment target from the alignment target subset, the distance determined in accordance with a provided field of view, and wherein the alignment target subset comprises fewer targets than locations to be reviewed, the alignment target being usable for aligning the object relative to an examination tool for capturing the locations associated with the single alignment target.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充