RADIATION GRATING DETECTOR AND X-RAY INSPECTION APPARATUS

• 收藏
• 分享

专利权人:

Shimadzu Corporation

发明人:

Satoshi SANO,Junichi OHI

申请号：

US15922223

公开号：

US20180267175A1

申请日:

2018.03.15

申请国别(地区):

US

年份:

2018

代理人:

摘要：

The radiation grating detector includes a grating portion constituting at least a second grating among a first grating, the second grating, and a third grating, and a detection portion configured to detect an incident radiation transmitted through the grating portion.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/