William C. Warger,Simon C. Schlachter,Joseph Gardecki,Brett Eugene Bouma,Guillermo J. Tearney
申请号：
US15070096
公开号：
US20160192845A1
申请日:
2016.03.15
申请国别(地区):
US
年份:
2016
代理人:
摘要：
Exemplary apparatus and method for obtaining information for at least one structure can be provided. For example, it is possible to forward at least one first electro-magnetic radiation to the at least one structure which is external from the apparatus. At least one second electro-magnetic radiation provided from the at least one structure (which is based on the first electro-magnetic radiation(s)) can be detected. It is also possible to determine at least one characteristic of the structure(s) based on the second electro-magnetic radiation(s), and obtain data relating to a pressure of at least one portion of the structure(s) based on the characteristic(s).
