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APPARATUS AND METHOD FOR ANALYZING IN VIVO COMPONENT AND IMPEDANCE MEASURING APPARATUS
专利权人:
SAMSUNG ELECTRONICS CO., LTD.;GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY
发明人:
Sung YANG,Kun Sun EOM,Myoung Hoon JUNG,Byung Jun KIM,Alexander ZHBANOV,Seung Yeob LEE,Ye Sung LEE
申请号:
US16743119
公开号:
US20200323468A1
申请日:
2020.01.15
申请国别(地区):
US
年份:
2020
代理人:
摘要:
An apparatus for analyzing an in vivo component is provided. The apparatus for analyzing an in vivo component may include an impedance sensor including a first electrode and a second electrode configured to contact a fluid channel of a fluid to be analyzed. The apparatus may include an impedance measurement device configured to apply a current to the first electrode and the second electrode, measure a voltage between the first electrode and the second electrode based on applying the current, and measure an impedance of the fluid based on the measured voltage. The apparatus may include a processor configured to model the measured impedance using an equivalent circuit; and analyze the in vivo component based on modeling the measured impedance using the equivalent circuit.
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中国工程科技知识中心
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