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TOPOGRAM-BASED FAT QUANTIFICATION FOR A COMPUTED TOMOGRAPHY EXAMINATION
专利权人:
Siemens Healthcare GmbH
发明人:
Michael GRASRUCK,Thomas FLOHR,Bernhard SCHMIDT
申请号:
US16697363
公开号:
US20200178920A1
申请日:
2019.11.27
申请国别(地区):
US
年份:
2020
代理人:
摘要:
In one embodiment, a method is for calculating an examination parameter for a computed tomography examination of an area of interest of a patient. The method includes receiving a topogram of the area of interest of the patient; determining fat distribution information by applying a trained machine learning algorithm onto the topogram; and calculating the examination parameter for the computed tomography examination of the area of interest of the patient based on the fat distribution information.
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中国工程科技知识中心
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http://www.ckcest.cn/home/

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