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光測定方法及び装置
专利权人:
興和株式会社
发明人:
鈴木 孝佳,荒川 泰男
申请号:
JP2006304680
公开号:
JP5221868B2
申请日:
2006.11.10
申请国别(地区):
JP
年份:
2013
代理人:
摘要:

PROBLEM TO BE SOLVED: To allow measurement of very weak light with reliability even if sensitivity of a photomultiplier tube changes due to aging or in temperature at measurement.

SOLUTION: Since the sensitivity characteristics of a photomultiplier tube 1 changes as time elapses, after a certain time has elapsed since initial calibration, a switch 16 is turned on to heat a heater 14, so that the temperature of the photomultiplier tube 1 is forcedly changed. The photomultiplier tube 1 is irradiated with a reference light from a reference light source 22 a photocount value is acquired with a counter 6, and a sensitivity change rate per unit temperature of the photomultiplier tube is calculated to calibrate the photomultiplier tube. With such a configuration, even if the sensitivity of the photomultiplier tube changes due to aging, reliable measurements of very weak light can be made.

COPYRIGHT: (C)2008,JPO&INPIT

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