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BRAIN REPAIR USING ELECTRICAL STIMULATION OF HEALTHY NODES
专利权人:
California Institute of Technology
发明人:
Melanie Wilke,Igor Kagan,Richard A. Andersen
申请号:
US13943227
公开号:
US20140018882A1
申请日:
2013.07.16
申请国别(地区):
US
年份:
2014
代理人:
摘要:
A method and system of compensating for a damaged brain node is disclosed. The damaged node is determined by techniques such as fMRI or neural recording. A healthy node that can compensate for the function of the damaged node is determined. A stimulating electrode is placed on at least one functioning node to bypass the activity from the damaged node to compensate for a missing node. The functioning node is then stimulated to compensate for the damaged node.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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