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MATERIAL PROPERTY MONITORING USING BACKSCATTER DEVICES
专利权人:
David Akselrod
发明人:
David Akselrod
申请号:
US15418414
公开号:
US20180017512A1
申请日:
2017.01.27
申请国别(地区):
US
年份:
2018
代理人:
摘要:
Embodiments of the present invention provide devices (tags), systems, and methods to determine structural integrity and other states of materials-of-interest, such as dental fillings, implants, and root canal posts, to name a few, in a non-invasive and contactless way; and using comparatively safe and/or low energy electromagnetic radiation, such as radio waves. Negligible-sized backscatter-tags with sensors are implanted in such materials-of-interest. Using backscatter imaging technology, the structural integrity and other states of the materials-of-interest may be monitored; which may allow non-invasive and contactless detection of problems such as cracking, bending, excessive pressure, improper temperature, and/or the like. Additionally, initially unknown locations of the implanted negligible-sized backscatter-tags with sensors may be readily determined upon a given scanning (reading) session; and thus mapped to provide an effective image of the material-of-interest.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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