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Yield prediction system and yield prediction device
专利权人:
株式会社日立製作所
发明人:
北野 佑,風間 頼子
申请号:
JP2013127094
公开号:
JP6147579B2
申请日:
2013.06.18
申请国别(地区):
JP
年份:
2017
代理人:
摘要:
The present invention estimates harvest with high accuracy using aerial images and time series weather data during specified crop growth stages while keeping the number of inspected fields to a minimum. From previously collected images and field attribute information for the inspected region and aerial images taken of the fields that are the target of the inspection, a parameter group to serve as determination criteria for selecting measurement fields that should be inspected is determined. The measurement fields are selected so that the parameter group has variance whenever possible. To reduce the burden of the inspection as much as possible, the measurement field candidates are selected so as to be locationally concentrated as much as possible. By analyzing the weather data time series patterns for each growth stage, a parameter group that correlates to the growth conditions is calculated and harvest is estimated using image feature values, field attribute information and the parameter group as explanatory variables.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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