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別個の入射エネルギ・スペクトルによる検出
专利权人:
ゼネラル・エレクトリック・カンパニイ
发明人:
シャオイェ・ウー,ジェイムズ・ダブリュ・ルブラン,サミット・クマール・バス
申请号:
JP2007274554
公开号:
JP5248083B2
申请日:
2007.10.23
申请国别(地区):
JP
年份:
2013
代理人:
摘要:
A CT system in an example comprises one or more high frequency electromagnetic energy sources, a detection assembly, a data acquisition system (DAS), and a computer. The one or more high frequency electromagnetic energy sources emit one or more beams of high frequency electromagnetic energy toward an object to be imaged. The detection assembly is capable of measuring a plurality of projection data at a same projection path that corresponds to a plurality of distinct incident energy spectra. The detection assembly comprises one or more energy discriminating (ED) detectors and/or one or more energy integration (EI) detectors that receive high frequency electromagnetic energy emitted by the one or more high frequency electromagnetic energy sources. The data acquisition system (DAS) is operably connected to the one or more ED detectors and/or the one or more EI detectors. The computer is operably connected to the DAS.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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