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DEVICES, SYSTEMS, AND METHODS FOR CONTROLLING ACQUISITION PARAMETERS WHEN CARRYING OUT A MEDICAL X-RAY EXAMINATION
专利权人:
Siemens Healthcare GmbH
发明人:
Elizaveta Stepina,Robert Brauweiler,Philip Mewes
申请号:
US16828223
公开号:
US20200305815A1
申请日:
2020.03.24
申请国别(地区):
US
年份:
2020
代理人:
摘要:
The disclosure relates to devices, systems, and methods for controlling acquisition parameters when carrying out a medical x-ray examination, wherein the device includes a lever. The lever includes a deflectably supported lever arm, which is embodied to be deflected from a rest position to a first end point, in particular a kick-down stop point, and to a second end point, by a force, in particular the force of a foot and/or the force of a hand, wherein a first value of at least one acquisition parameter of the medical x-ray examination is determined by the deflection, wherein the first value is dependent on a measure of deflection of the deflection of the lever arm from the rest position to the first end point, wherein a second value of at least one acquisition parameter of the medical x-ray examination is able to be determined by a deflection of the lever arm to the second end point, and wherein the second value is independent of the measure of deflection of the deflection of the lever arm from the rest position.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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