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断層像撮影装置
专利权人:
KOWA COMPANY; LTD.
发明人:
KOBAYASHI, Naoki,小林 直樹,NAKAGAWA, Toshiaki,中川 俊明
申请号:
JPJP2015/071443
公开号:
WO2016/017664A1
申请日:
2015.07.29
申请国别(地区):
WO
年份:
2016
代理人:
摘要:
This tomography device has: a first imaging mode wherein a two-dimensional raster scan is performed such that a measuring beam is incident on a target object (E), and a tomogram of the target object (E) is captured and a second imaging mode wherein a two-dimensional raster scan that subsamples the raster scan of the first imaging mode is performed such that a measuring beam is incident on the target object (E), and a tomogram of the target object (E) is captured. A display means (18) is configured so as to be able to switch between a first display mode, wherein a plurality of tomographic images that include a target object (E) region of interest are selected from among tomographic images that are generated on the basis of a tomogram that is captured in the second imaging mode and only said plurality of tomographic images are displayed, and a second display mode, wherein all of the tomographic images that are generated on the basis of the tomogram that is captured in the second imaging mode are displayed in order. The device adjusts the image capturing conditions that are necessary for capturing tomograms in the first image capturing mode, separately performing a first adjustment operation that is based on the tomographic images displayed in the first display mode and a second adjustment operation that is based on the tomographic images displayed in the second display mode, and then captures tomograms in the first imaging mode.Linvention concerne un dispositif de tomographie qui possède : un premier mode dimagerie, dans lequel un balayage ligne par ligne bidimensionnel est effectué de telle sorte quun faisceau de mesure est incident sur un objet cible (E), et une tomographie de lobjet cible (E) est capturée un second mode dimagerie, dans lequel un balayage ligne par ligne bidimensionnel, qui sous-échantillonne le balayage ligne par ligne du premier mode dimagerie, est effectué de telle sorte quun faisceau de mesure est incident sur lobjet cible (E), et une tomograph
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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