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SAFT analysis of defects close to the surface
专利权人:
SIEMENS AKTIENGESELLSCHAFT
发明人:
Mooshofer Hubert
申请号:
US201414898227
公开号:
US9989500(B2)
申请日:
2014.01.16
申请国别(地区):
美国
年份:
2018
代理人:
Slayden Grubert Beard PLLC
摘要:
A method and device for the ultrasonic testing of test objects by means of a test head. A computer device directly acquires, during a SAFT analysis for determining points in time of the amplitudes to be summed up from among the image time signals, a propagation time, which depends on the test head, from the test head positioned at a measuring point to the location of each of a plurality of voxels and uses the propagation time for calculating an amplitude total for the plurality of voxels.
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中国工程科技知识中心
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