Scott Kendyl Stanley,Andrew Paul Rapach,Robert Webbink
申请号：
US16528693
公开号：
US20200046226A1
申请日:
2019.08.01
申请国别(地区):
US
年份:
2020
代理人:
摘要：
A method for evaluating fit of an applicator can include receiving on a process first and second sets of digital data representing the target area and at least a portion of the applicator, respectively, digitally overlying the second set of digital data over the first set of digital data； calculating in the target area at a plurality of points of the overlay a separation distance between the sets of data and generating an electronic image that includes a visual depiction of the calculated separation distance.
