您的位置: 首页 > 农业专利 > 详情页

METHOD AND APPARATUS FOR DEFECT DETECTION
专利权人:
发明人:
DANIEL CONSTANTIN BODEA,PATRICK HAMPE
申请号:
IN2161/CHENP/2011
公开号:
IN2011CN02161A
申请日:
2011.03.30
申请国别(地区):
IN
年份:
2012
代理人:
摘要:
A system for detecting a defect in a membranous article comprising an emitter probe connected to an electrical supply, said probe insertable into a cavity of said article a sensor for receiving an electrical discharge from said probe a conveyor system for bringing the probe and sensor into mutual proximity a processor for measuring the potential difference between the probe and sensor, said processor capable of detecting a defect based upon said measurement.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充