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APPARATUS AND METHOD FOR LARGE FIELD-OF-VIEW MEASUREMENTS OF GEOMETRIC DISTORTION AND SPATIAL UNIFORMITY OF SIGNALS ACQUIRED IN IMAGING SYSTEMS
专利权人:
THE PHANTOM LABORATORY; INCORPORATED
发明人:
Richard P. MALLOZZI,Joshua R. LEVY
申请号:
US16721048
公开号:
US20200121276A1
申请日:
2019.12.19
申请国别(地区):
US
年份:
2020
代理人:
摘要:
An apparatus and method for imaging quality assessment of an imaging system employs an aggregate phantom and a processor for imaging analysis. The aggregate phantom includes a plurality of self-contained sections configured to be moved independently and re-assembled in the imaging system. Each section includes fiducial features of known relative location. The processor: quantitatively determines location of the fiducial features within an image of the aggregate phantom; compares the determined location within the image to the known relative location of the fiducial features to produce a distortion field; and distinguishes between actual geometric distortion of the imaging system and rigid-body transformations of sections of the aggregate phantom, in the distortion field. For extended fields-of-view, the aggregate phantom may be repositioned, and sets of images combined to determine a distortion field of the extended image. A method employing virtual features for measuring spatial uniformity of an acquired signal, is also provided.
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