MANUFACTURING METHOD OF BRAIN WAVE MEASURING BAND AND BRAIN WAVE MEASURING BAND MANUFACTURED BY SAME

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专利权人:

GWANG AN METALOYTOOLS CO., LTD.;주식회사 광안정밀

发明人:

LEE EUN KYUNG,이은경

申请号：

KR1020180049809

公开号：

KR1020190125693A

申请日:

2018.04.30

申请国别(地区):

KR

年份:

2019

代理人:

摘要：

The present invention relates to a manufacturing method of a brain wave measuring band and the brain wave measuring band manufactured by the same, which has high productivity due to low defect rate.COPYRIGHT KIPO 2020본 발명은 불량률이 낮아서 생산성이 우수한 새로운 방식의 뇌파측정밴드 제조방법 및 이에 의해 제조된 뇌파측정밴드에 관한 것이다.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/